We give you this day double your daily ration of studies about bread: “PROTON INDUCED X-RAY EMISSION ANALYSIS OF TRACE ELEMENTS IN THICK BREAD SAMPLES,” Mohamed Baker Al-Bedri, Ikram Jameel Abdul Ghani, Ibrahim Abdul Rahman Al-Aghil, International Journal of PIXE, Volume: 19, Issues: 3-4(2009) pp. 133-141. (thanks to investigator Tom Gill for bringing this to our […]