Nit-Picking Confidence, Algorithmically in Parallel

For people who like to find faults, good  news appeared in 1989, in this study:

Locating Faults in a Constant Number of Parallel Testing Rounds,” Richard Beigel, S. Rao Kosaraju [pictured here], and  Gregory F. Sullivan, Proceedings of the First Annual ACM Symposium on Parallel Algorithms and Architectures, March 1989, pp. 189–198. The authors, at Johns Hopkins University, explain:

We show, surprisingly, that a constant number of rounds of parallel testing are sufficient to identify all faults (in all cases where fault identification is possible).